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The facility provides advanced analytical capabilities, including an X-ray Fluorescence (XRF) spectrometer, which serves as an Institute facility for precise elemental analysis. In addition, a Scanning Electron Microscope (SEM) and an Electron Probe Micro Analyser (EPMA), currently housed in AFMM, IISc, offer detailed microstructural and compositional insights.

Ever wondered how a thin section is made?
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