Scanning Electron Microscopy
Instrument model: JEOL® IT-300
Description: 30 kV Tungsten/LaB6 Source SEM for SE/BSE imaging with EDS spectroscopy and Cathodoluminescence (SEM-CL) experiments.
Specifications and uses:
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Tungsten/LaB6 source with variable accelerating voltage up to 30kV.
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Load lock chamber for quick sample exchange and stage navigation system.
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SE/BSE imaging with resolution up to 1 μm.
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Cathodoluminescence (SEM-CL) detector for CL experiments to find impurities in samples.
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EDAX® EDS detector for qualitative chemical analysis.
Electron Probe
Micro Analyser
Instrument model: JEOL® JXA-8230
Description: 30 kV Tungsten/LaB6 source EPMA with high resolution X-ray EDS/WDS analysis.
Specifications and Capabilities:
· Tungsten/LaB6 source with variable accelerating voltage up to 30kV
· SDD type EDS detector.
· Five Wavelength Dispersive spectrometers with 2 crystals per spectrometer and detectable wavelength for elements ranging from B to U
Uses:
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Quantitative analysis: Accurate quantification of chemical composition of any solid material at very small "spot" sizes (1-2 microns).
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Qualitative analysis: EDS/WDS Spectrum-To find out the elements present.
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BSE and SE Imaging: Phase Identification, Mineral Identification
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X-Ray Mapping for elemental distribution: X-Ray mapping is useful to see the distribution of elements at the area of interest and segregation of impurities in metal samples.
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Chemical dating: Monazite dating.
SEM and EPMA Facility (currently housed in Advanced Facility for Microscopy and Microanalysis)
