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Scanning Electron Microscopy

Instrument model: JEOL® IT-300

Description: 30 kV Tungsten/LaB6 Source SEM for SE/BSE imaging with EDS spectroscopy and Cathodoluminescence (SEM-CL) experiments.

Specifications and uses:

  • Tungsten/LaB6 source with variable accelerating voltage up to 30kV.

  • Load lock chamber for quick sample exchange and stage navigation system.

  • SE/BSE imaging with resolution up to 1 μm.

  • Cathodoluminescence (SEM-CL) detector for CL experiments to find impurities in samples.

  • EDAX® EDS detector for qualitative chemical analysis.


Electron Probe
Micro Analyser

Instrument model: JEOL® JXA-8230

Description: 30 kV Tungsten/LaB6 source EPMA with high resolution X-ray EDS/WDS analysis.

Specifications and Capabilities:

· Tungsten/LaB6 source with variable accelerating voltage up to 30kV

· SDD type EDS detector.

· Five Wavelength Dispersive spectrometers with 2 crystals per spectrometer and detectable wavelength for elements ranging from B to U


  1. Quantitative analysis: Accurate quantification of chemical composition of any solid material at very small "spot" sizes (1-2 microns).

  2. Qualitative analysis: EDS/WDS Spectrum-To find out the elements present.

  3. BSE and SE Imaging: Phase Identification, Mineral Identification

  4.  X-Ray Mapping for elemental distribution: X-Ray mapping is useful to see the distribution of elements at the area of interest and segregation of impurities in metal samples.

  5. Chemical dating: Monazite dating.


SEM and EPMA Facility (currently housed in Advanced Facility for Microscopy and Microanalysis)

The globe represents the palette of the Petra group. Petra is short for Petrology which is the branch of Geology dealing with the study on rocks.
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